Contacto
Cómo comprar
Entrega
Guía de compras
Advanced Test Methods for SRAMs
Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Inglés
290 b
Política de devolución de 30 días
Clientes que también han comprado
/
Tapa blanda
49.19
€
Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.
Sobre el libro
Inglés
Categorías
Regale este libro hoy
Es fácil
1 Añadir al carrito y elegir Entregar como regalo en el checkout 2 Le enviaremos un vale 3 El libro llegará a la dirección del destinatarioTambién puede interesarle
/
Tapa blanda
16.39
€
/
Tapa blanda
20.09
€
¡Hola! Soy Libroamiko, tu asesor de libros.
¿Cómo puedo ayudarte?