2 913 254 libros electrónicos en 110 idiomas
¿No le conviene? No hay problema. Puedes devolver los artículos hasta 30 días
No se equivocará con un vale de regalo. El destinatario puede elegir cualquier producto de nuestra oferta.
Hasta 30 días para devoluciones
Advances in Imaging and Electron Physics series, Volume 226, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Provides the authority and expertise of leading contributors from an international board of authors Presents the latest release in the Advances in Imaging and Electron Physics series
¡Hola! Soy Libroamiko, tu asesor de libros.
¿Cómo puedo ayudarte?