Handbook of Transmission Electron Microscopy

Handbook of Transmission Electron Microscopy is a practical and detailed guide to the principles, instruments, methods, and applications of modern TEM. It is written for students, researchers, laboratory scientists, materials engineers, and microscopy professionals who need a clear reference for study, experiment planning, data analysis, and technical reporting.

The book begins with electron-specimen interactions, electron optics, microscope architecture, resolution, alignment, and calibration. It then explains specimen preparation for metals, ceramics, semiconductors, powders, thin films, interfaces, polymers, and site-specific FIB samples.

Readers will learn how images and diffraction patterns are formed and how to choose suitable methods for a given materials problem. The chapters cover bright-field and dark-field imaging, diffraction contrast, phase contrast, HRTEM, STEM, HAADF imaging, SAED, CBED, nano-beam diffraction, precession electron diffraction, and 4D-STEM.

The analytical electron microscopy sections provide clear guidance on:

• Energy-dispersive X-ray spectroscopy, including EDS spectra, elemental mapping, peak identification, quantification, and uncertainty
• Electron energy-loss spectroscopy, including EELS calibration, low-loss analysis, core-loss edges, ELNES, EFTEM, thickness measurement, and chemical-state interpretation
• Electron tomography and three-dimensional reconstruction
• Cryo-TEM and low-dose imaging for beam-sensitive materials
• In situ and operando TEM for heating, cooling, electrical biasing, mechanical testing, gas-cell work, and liquid-cell studies
• Quantitative image analysis, calibration, measurement uncertainty, data integrity, and reproducible workflows