Contacto
Cómo comprar
Entrega
Guía de compras
X-ray Scattering from Semiconductors
Inglés
311 b
Hasta 30 días para devoluciones
Clientes que también han comprado
/
Tapa blanda
47.29
€
X-ray scattering is used extensively to provide detailed structural information about materials. Semiconductors have benefited from X-ray scattering techniques as an essential feedback method for crystal growth, including compositional and thickness determination of thin layers. The methods have been developed to reveal very detailed structural information concerning material quality, interface structure, relaxation, defects, surface damage, and more. This text provides a description of the techniques involved in obtaining that information, including X-ray diffractometers and their associated instrument functions, data collection methods, and the simulation of the diffraction patterns observed. Also presented are examples and procedures for interpreting the data to build a picture of the sample, much of which is common to materials other than semiconductors.
Sobre el libro
Inglés
Regale este libro hoy
Es fácil
1 Añadir al carrito y elegir Entregar como regalo en el checkout 2 Le enviaremos un vale 3 El libro llegará a la dirección del destinatarioTambién puede interesarle
/
Tapa blanda
8.89
€
/
Tapa blanda
19.09
€
¡Hola! Soy Libroamiko, tu asesor de libros.
¿Cómo puedo ayudarte?